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地址:教九506
邮编:310027
电话:87951730
传真:87951941
邮箱:mbfju@zju.edu.cn

居冰峰

教授,博导

教育背景

  • 博士,浙江大学,1999

  • 硕士,哈尔滨工业大学,1996

  • 学士,哈尔滨工业大学,1994

个人简介

居冰峰:男,19729月出生。教授,博士生导师,国家杰出青年基金获得者。1999年获得浙江大学工学博士学位。2000-2002年在新加坡Nanyang Technological University从事博士后研究,2002-2003年在新加坡DSO National Laboratories担任Research Scientist2003 -2005年在日本東北大学担任日本学术振兴会(JSPS)外国人特别研究员,2005-2007年担任该校助理教授。20074月回国工作并晋升为浙江大学机械工程系教授,2009-2014年担任流体动力与机电系统国家重点实验室副主任。主要研究方向为微纳测量、精密机电系统以及超精密加工技术等。作为第一获奖人获得中国机械工业科学技术奖一等奖1项(2013)、教育部技术发明奖二等奖1项(2013),德国洪堡奖学金获得者(2003)、日本学术振兴会奖学金获得者(2003)。2011年入选教育部“新世纪优秀人才”支持计划,2014年国家自然科学基金杰出青年基金获得者。共发表论文100余篇,其中SCI检索国际期刊论文45篇、EI收录论文80余篇,获得授权国家发明专利15件、日本发明专利1件。此外,已培养博士后1名、博士3名、硕士9名,指导的2名博士生获教育部“博士研究生学术新人奖”。

研究方向

  • 精密测量

  • 微纳制造及测量系统

  • 图像技术及仪器

  • 信号及图像处理

任职经历

2009.01-2014.12流体动力与机电系统国家重点实验室副主任
2007.04-现在浙江大学教授
2005.11-2007.04东北大学(日本)
助理教授
2005.03-2005.09加州大学伯克利分校(美国)高级访问学者
2003.11-2005.11东北大学(日本)

日本学术振兴会(JSPS)特别研究员

2002.05-2003.11DSO National Laboratory(新加坡)研究员

重要奖项

  • 国家杰出青年基金获得者,2014

  • 教育部技术发明奖二等奖,2013

  • 教育部“新世纪优秀人才支持计划”,2011

  • 浙江省自然科学基金杰出青年学者奖,2009

  • 浙江省新世纪151人才奖

  • 德国洪堡奖学金,2003

  • 日本学术振兴会奖学金,2003

  • 罗克韦尔自动化奖

学术活动

  • 中国机械工程学会会员

  • 中国机械工程学会金属切削委员会委员

  • 第八届杭州流体传动及控制国际会议(icfp2013)秘书长

  • 第七届杭州流体传动及控制国际会议(icfp2009)副主席

  • 第六届国际自动控制联盟机械电子系统国际会议(MECH2013)程序委员会委员

重要专利

发明专利

[17] 基于扫描隧道效应的在位测量装置及扫描探针自动对中方法,发明专利,201310048915.5,已公开

[16] 一种基于高斯回波模型测量薄层材料厚度的方法,发明专利,201310121229.6,已公开

[15] 一种低噪声高带宽隧道电流前置放大电路,发明专利,201210204622.7,已公开

[14] 扫描超声波显微镜同时测量薄层材料机械特性参数的方法,发明专利,201210530937.0,已公开

[13] 扫描超声波显微镜同时测量薄层材料厚度、声速、密度和衰减的方法,发明专利,201210042497.4,已公开

[12] 基于光学投影的无透镜显微成像方法及其装置,发明专利,201110297005.1,已公开

[11] 用于测量具有垂直侧壁微结构的扫描隧道显微镜倾斜测量方法,发明专利,201110339077.8,已公开

[10] 倒指数形状、高长-径比扫描隧道显微镜探针的制备工艺,发明专利,201110078164.2,已公开

[9] 具有大范围和高深-宽比测量能力的扫描隧道显微镜,发明专利,201110338282.2,已公开

[8] 一种基于激光自准直的二维微角度测量装置,发明专利,201110069375.X,已公开

[7] 在回转件上快速加工出大面积三维微纳结构的方法,发明专利,200810062983.6,已公开

[6] 一种基于双轴联动的扫描超声波显微镜快速扫描方法,发明专利,ZL201210042624.0,已授权

[5] 一种扫描超声波显微镜同时进行多层扫描成像的方法,发明专利,ZL201110246410.0,已授权

[4] 一种扫描超声波显微镜自动对焦方法,发明专利,ZL201010520433.1,已授权

[3] 用于大幅度微纳结构的扫描探针测量系统及其方法,发明专利,ZL201210204638.8,已授权

[2] 用于扫描探针显微镜的螺旋式扫描方法,发明专利,ZL200810062982.1,已授权

[1] 用于扫描隧道显微镜的纯钨材质微纳探针制备控制系统,发明专利,ZL200810062984.0,已授权

实用新型

[2] 基于扫描隧道效应的在位测量装置,实用新型,ZL201320070913.1,已授权

[1] 一种具有大范围和高深-宽比测量能力的扫描隧道显微镜,实用新型,ZL201120424355.5,已授权

重要论文

Journal:

[40] Bai X L, Fang Y M, Lin W S, Wang L P, Ju B-F*. Saliency-Based Defect Detection in Industrial Images by Using Phase Spectrum. IEEE Transaction on Industrial Informatics, Accepted for publication, 2014 (IF: 8.785, SCI/EI)

[39] Bai X L, Sun Z Q, Sun A Y, Chen J, Ju B-F*. Determination of the multiple local properties of thin layer with high lateral resolution by scanning acoustic microscopy. Review of Scientific Instruments, 85: 094901, 2014 (IF: 1.584, SCI/EI)

[38] Ju B-F*, Zhu W-L, Yang S Y, Yang K J. Scanning tunneling microscopy-based in situ measurement of fast tool servo-assisted diamond turning micro-structures. Measurement Science and Technology, 25: 055004, 2014IF1.352SCI/EI

[37] Chen Y L, Zhu W L, Yang S Y, Ju B-F*. Large-area profile measurement of sinusoidal freeform surfaces using a new prototype scanning tunneling microscopy. Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology, 38: 414-420, 2014IF1.393SCI/EI

[36] Xia C L, Wu Y F, Lu Q Q, Ju B-F. Surface characteristic profile extraction based on Hilbert-Huang transform. Measurement, 47: 306-313, 2014IF1.130SCI/EI

[35] Ju B-F*, Zhu W L and Yang S Y. Symmetric modulation methodology applied in improving the performance of scanning tunneling microscopy. Review of Scientific Instruments, 84: 126107, 2013IF1.602SCI/EI

[34] Ju B-F*, Bai X L, Chen J. Design of optimal fast scanning trajectory for the mechanical scanner of measurement instruments. Scanning- The Journal of Scanning Microscopies, doi: 10.1002/sca.21084, 2013IF1.287SCI/EI

[33] Bai X L, Sun Z Q, Chen J, Ju B-F*. A novel technique for the measurement of the acoustic properties of a thin linear-viscoelastic layer using a planar ultrasonic transducer. Measurement Science and Technology, 24: 125602, 2013IF1.435SCI/EI

[32] Ge Y Z, Zhang W, Chen Y L, Jin C, Ju B-F*. A reproducible electropolishing technique to customize tungsten SPM probe: From mathematical modeling to realization. Journal of Materials Processing Technology, 213: 11-19, 2013IF1.953SCI/EI

[31] Chen J, Bai X L, Yang K J, Ju B-F*. An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution technique. Ultrasonics, 53:1377-1383, 2013IF2.028SCI/EI

[30] Zou C Y, Luo Q, Qin J, Le Visage C, Ju B-F, Leong K W. Osteopontin promotes mesenchymal stem cell migration and lessens cell stiffness via integrin beta 1, FAK, and ERK pathways. Cell Biochemistry and Biophysics, 65: 455-462, 2013IF1.912SCI/EI

[29] Ju B-F*, Bai X L, Chen J. Simultaneous measurement of local longitudinal and transverse wave velocities, attenuation, density, and thickness of films by using point-focus ultrasonic spectroscopy. Journal of Applied Physics, 112: 084910, 2012IF2.210SCI/EI

[28] Ju B-F*, Chen Y-L, Zhang W, Zhu W L, Jin C, Fang F Z. Long range and accurate measurement of deep trench microstructures by a specialized scanning tunneling microscope. Review of Scientific Instruments, 83: 056106, 2012IF1.602SCI/EI

[27] Ju B-F*, Bai X L, Chen J. Fast scanning mode and its realization in a scanning acoustic microscope. Review of Scientific Instruments, 83: 035113, 2012IF1.602SCI/EI

[26] Ju B -F*, Chen Y L, Zhang W, Fang F Z. Rapid measurement of a high step microstructure with 90°steep sidewall. Review of Scientific Instruments, 83: 013706, 2012IF1.602SCI/EI

[25] Chen J, Bai X L, Yang K J, Ju B-F*. Angular measurement of acoustic reflection coefficients by the inversion of V(z, t) data with high frequency time-resolved acoustic microscopy. Review of Scientific Instruments, 83: 014901, 2012IF1.602SCI/EI

[24] Jia K, Yang K J, Fan Z W, Ju B-F*. A contactless methodology of picking up micro-particles from rigid surfaces by acoustic radiation force. Review of Scientific Instruments, 83: 014902, 2012IF1.602SCI/EI

[23] Chen J, Bai X L, Yang K J, Ju B -F*. The computations of reflection coefficients of multilayer structure based on the reformulation of Thomson-Haskell method. Ultrasonics, 52: 10191023, 2012IF2.028SCI/EI

[22] Yan T H, Xu X S, Han J Q, Ju B-F. Optimization of sensing and feedback control for vibration/flutter of rotating disk by PZT actuators via air coupled pressure. Sensors, 11: 3094-3116, 2011IF1.953SCI/EI

[21] Ju B-F*, Chen Y -L, Ge Y Z. The art of electrochemical etching for preparing tungsten probes with controllable tip profile and characteristic parameters. Review of Scientific Instruments, 82: 013707, 2011IF1.602SCI/EI

[20] Ju B-F*, Wu L. A methodology for quantitative evaluation of local electrical conductivity: from micron to submicron. Microsystem Technologies, 15: 1827-1834, 2009IF0.827SCI/EI

[19] Ju B-F*, Chen Y L, Fu M, Chen Y, Yang Y H. Systematic study of electropolishing technique for improving the quality and production reproducibility of tungsten STM probe. Sensors and Actuators A: Physical, 155: 136-144, 2009IF1.841SCI/EI

[18] 吴蕾葛耀峥居冰峰*. 金属薄膜导线的亚微米局域电导率精确测量技术机械工程学报, 47(4): 1-6, 2011EI)

[17] 居冰峰*, 巨阳坂真澄基于原子力显微镜的四电极微探针局域电导率测量技术机械工程学报, 45(4):187-190, 2009EI

[16] Ju B-F*, Ju Y, Saka M. Quantitative measurement of submicrometre electrical conductivity. Journal of Physics D - Applied Physics, 40: 7467-7470, 2007IF2.528SCI/EI

[15] Ju B-F*. In situ elasticity and adhesion measurement of biomembrane by a video enhanced depth-sensing indentation technique. Materials Science & Engineering C-Biomimetic and Supermolecular Systems, 27:135-141, 2007IF2.404SCI/EI

[14] Ju B -F*, Liu K -K, Wong M F. A novel cylindrical punch method to characterize interfacial adhesion and residual stress of a thin polymer film. Engineering Fracture Mechanics, 74: 1101-1106, 2007IF1.413SCI/EI

[13] Gao W, Aoki J, Ju B-F, Kiyono S. Surface profile measurement of a sinusoidal grid using an atomic force microscope on a diamond turning machine. Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology, 31: 304-309, 2007 IF1.393SCI/EI

[12] Asai T, Motoki T, Gao W, Ju B-F, Kiyono S. An AFM-based edge profile measuring instrument for diamond cutting tools. International Journal of Precision Engineering and Manufacturing, 8: 54-58, 2007IF1.585SCI/EI

[11] Shibuya A, Gao W, Yoshikawa Y, Ju B-F, Kiyono S. Profile measurements of micro-aspheric surfaces using an air-bearing stylus with a microprobe. International Journal of Precision Engineering and Manufacturing, 8: 26-31, 2007 IF1.585SCI/EI

[10] Ju B-F*, Ju Y. Video enhanced depth-sensing indentation technique for characterizing mechanical behaviour of biomaterials. Measurement Science and Technology, 17: 1776-1784, 2006IF1.435SCI/EI

[9] Ju B-F, Ju, Y, Saka, M. Measurement of electrical conductivity of micron-scale metallic wires. Transactions of Nonferrous Metals Society of China,16: S759-S762, 2006 IF0.917SCI/EI

[8] Ju Y, Ju B-F*, Saka M. Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement. Review of Scientific Instruments, 76: 086101, 2005 IF1.602SCI/EI

[7] Ju B-F*, Ju Y, Saka M. A systematic method for characterizing the elastic properties and adhesion of a thin polymer membrane. International Journal of Mechanical Sciences, 47: 319-332, 2005IF1.613SCI/EI

[6] Ju B-F*, Ju Y, Saka M. Fabrication of a microscopic four-point probe and its application to local conductivity measurement. Journal of Micromechanics and Microengineering, 15: 2277-2281, 2005IF1.790SCI/EI

[5] Ju B-F*, Wan K T, Liu K K. Indentation of a square elastomeric thin film by a flat-ended cylindrical punch in the presence of long-range intersurface forces. Journal of Applied Physics, 96: 6159-6163, 2004IF2.210SCI/EI

[4] Chan V, Liu K K, Le Visage C, Ju B-F, Leong, K W. Bioadhesive characterization of poly(methylidene malonate 2.12) microparticle on model extracellular matrix. Biomaterials, 18: 4327-4332, 2004IF7.604SCI/EI

[3] Ju B-F*, Liu K K. Characterizing viscoelastic properties of thin elastomeric membrane. Mechanics of Materials, 34: 485-491, 2002 IF1.936SCI/EI

[2] Ju B-F*, Liu K K, Ling S F.A novel technique for characterizing elastic properties of thin biological membrane. Mechanics of Materials, 34: 749-754, 2002 IF1.936SCI/EI

[1] Liu K K, Ju B-F. A novel technique for mechanical characterization of thin elastomeric membrane. Journal of Physics D-Applied Physics, 34: L91-L94, 2001 IF2.528SCI/EI

 

Conference papers:

[17] Bai X L, Chen J, Ju B-F*. Simultaneous measurement of elastic moduli, attenuation, density, and thickness of a layer by ultrasonic spectroscopy using point-focus transducer. Proceedings of IEEE International Ultrasonics Symposium, Oct.7-10, Dresden, Germany, 2012EI

[16] Zhang W, Jin C, Chen Y L, Ju B-F*. Dual-servo mechanism of STM for measurement of sub millimeter deep trench structures. Proceedings of 8th CHINA-JAPAN International Conference on Ultra-Precision Machining, Nov. 20-22, Hangzhou, China, 2011EI

[15] Sun A Y, Ju B-F*. The acoustic micro integrated detection technique for silicon wafer processing. Proceedings of 8th CHINA-JAPAN International Conference on Ultra-Precision Machining, Nov. 20-22, Hangzhou, China, 2011EI

[14] Fang F, Bai X L, Ju B-F*. Realization of two-axis macro-micro dual-driven system. Proceedings of 3rd International Conference on Mechanical and Electronics Engineering, Sep. 23-25, Hefei, China, 2011EI

[13] Chen Y L, Ju B-F*. Electrochemical preparation of STM probes for high aspect ratio nanometrology. Proceeding of 10th IEEE international conference on nanotechnology joint symposium, Aug. 17-20, Soul, Korea, 2010EI

[12] Lian M D, Ju B-F*. A compact 2D micro-angle sensor. Proceedings of 10th International Symposium on Measurement and Quality Control, Sep. 5-9, Osaka, Japan, 2010EI

[11] Chen Y L, Ju B-F*. A novel scanning tunneling microscopy for long range and high aspect ratio measurement. Proceedings of 10th International Symposium on Measurement and Quality Control, Sep. 5-9, Osaka, Japan, 2010EI

[10] Fu M M, Guo K K, Chen Y, Yang Y H, Ju B-F*. Application of high aspect ratio scanning probe in microstructure measurement. Proceedings of 7th China-Japan International Conference on Ultra-Precision Machining, Nov.24-25, Changsha, China, 2008EI

[9] Shibuya A, Gao W, Yoshikawa Y, Ju B-F, Kiyono S. Profile measurements of micro-aspheric surfaces using an air-bearing stylus with a microprobe. Proceedings of 2nd International Conference on Positioning Technology, Oct. 12-13, Jeju, Korea, 2006EI

[8] Asai T, Motoki T, Gao W, Ju B-F, Kiyono S. An AFM-based edge profile measuring instrument for diamond cutting tools. Proceedings of 2nd International Conference on Positioning Technology, Oct. 12-13, Jeju, Korea, 2006EI

[7] Ju B-F*, Ju Y, Saka M. Measurement of electrical conductivity of micron-scale metallic wires. Proceedings of 5th International Forum on Advanced Material Science and Technology, Jun.14-17, Changsha, China, 2006EI

[6] Ju B-F*, Ju Y, Saka M. Novel AFM probe for local conductivity measurement. Proceedings of  3rd International Conference on Materials for Advanced Technologies, Jul.03-08, Singapore, 2005EI

[5] Ju B-F*, Ju Y, Saka M. Development of a new microscopic four-point AFM probe for the measurement of local electrical conductivity. Proceedings of ASME/Pacific Rim Technical Conference on Integration and Packaging of MEMS, NEMS, and Electronic Systems,Jul.17-22, San Francisco, USA, 2005EI

[4] Ju B-F*, Ju Y, Saka M. A methodology for damage strength evaluation of a single biomimetic microcapsule. Proceedings of Asian Pacific Conference on Fracture and Strength, Oct.6-8,Jeju, Korea, 2004EI

[3] Ju B-F*, Liu K K. Characterizing viscoelastic properties of thin elastomeric membrane. Proceedings of  Symposium on Durability of Elastomeric Material Systems, Jun 5-8, San Diego, USA, 2001EI

[2] Ju B-F*, Liu K K. Novel technique for mechanical characterization of thin polymeric tissue membrane. Proceedings of  7th Australian and New Zealand Intelligent Information Systems Conference, Nov.18-21, Perth, Australia, 2001EI

[1] Ju B-F*, Liu K K, Ling S F. An new instrument for measuring mechanical compliance of micro-systems.  Proceedings of 2nd International Conference on Experimental Mechanics, Nov.29-Dec. 01, Singapore, 2000EI

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